The UK Medium Energy Ion Scattering facility, (MEIS) uses an ion beam probe which enables the investigation of the surface structure and properties of crystalline materials as well as the high resolution depth profiling of non-crystalline nano metre thin layers. An ion source generates a beam of positively charged light ions, typically hydrogen or helium, which is accelerated to energy between 50 keV and 200 keV and scattered off the sample under investigation. Although a very powerful technique, the comparatively high equipment cost means that there are fewer than ten MEIS machines world-wide.
The experimental station facilities comprise four interconnected UHV systems between which samples can be transferred under UHV conditions:
We hope that the MEIS system will support a thriving user community. Potential users, for research and commercial applications are invited to contact either Professor Jaap Van Den Berg (J.VanDenBerg@hud.ac.uk) or Dr. Andrew Rossall (A.Rossall@hud.ac.uk) to discuss possibilities.
Ion Energy Analyser
Two-dimensional (energy and angle) ion detector