Portrait of Dr Xiaomei Chen Dr Xiaomei Chen

x.chen2@hud.ac.uk | 01484 473844



Biography

Xiaomei Chen attained her BEng in precision mechanical instrumentation and MEng in automatic test, measurement and control from Harbin Institute of Technology (HIT) in China.

Then she joined Changcheng Institute of Metrology and Measurement (CIMM) Beijing, Aviation Industry Cooperation of China (AIVC) as an assistant engineer, engineer, then senior engineer and metrologist in research and development of metrology instruments on geometrical and mechanical quantities. She has been working there for many years until she went to Physiklisch-Technischen Bundsanstalt (PTB), Germany in Aug 2008 as a research assistant (wissenschaftlische Mitarbeiterin) toward PhD on Nanometrology in surface metrology department.  

In Oct 2011, she earned Dr. Ing. (PhD) degree on Electrotechnik and Nanometrology from Technische Universität Braunschweig , one of TU9-Universitäten in Germany. During the period in CIMM she involved, launched and organized many R & D projects that vary from surface roughness interferogram processing system, nanometer scale 2D laser heterodyne inteferometer prototype, Brunel hardness indentation vision measuring microscope device, dual-sensor autofocusing system for measuring a pattern of small holes on complex curved surface, an atomic force microscope (AFM) based on the optical cantilever deflection detection technology and small aspherical surface form coordinate measurement technique based on a nano-measuring machine (NMM) etc. In PTB, she developed one tuning-fork cantilever AFM and three tuning-fork cantilevers AFM for nanoscale resolution displacement measurement by using AFM as an encoder.

She had worked in EEIE Department of City University London from 2000 to 2001 as an academic visiting researcher and has participated research on dual measurements of temperature and strain by using erbium doped optical fibre fluorescence sensor and erbium doped fibre Bragg grating sensor.  She had got training for one month in 2005 for nanometrology and nano-measuring machine in SIOS Meβtechnik GmbH, Germany as a trainee.  She joined in CPT, University of Huddersfield in June 2012 as a research fellow on manufacturing metrology.

Research and Scholarship

Major Research Area:

  • Instrumentation  and  ( optical,  mechanical  and  electrical )  system  integration for manufacturing metrology and measurement .
  • AFM- and STM-based Instrumentation and technology for nanometrology and surface characterisation.
  • Image processing and vision inspection for industry metrology and measurement.

Awards and Honors:

  • Scholarship holder of Ministry of Science and Culture of Niedersachsen State, Germany 9/2008-8/2009, pursued first year research toward PhD by registering at Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik in Technische Universität Braunschweig.
  • Work contract with PTB, Germany: 9/2009-11/2011: pursued another two years research toward PhD in PTB.
  • Scholarship holder of Chinese Scholarship Council (CSC), 3/2000-3/2001, pursued research in City University London for one year as academic visitor (visiting scholar).
  • 2nd price winner of science and technology progress in 1996, awarded by Aviation Industry Ministry of China for the project of Surface roughness interferogram processing system.
     

Some successful research funding from Aviation Science Technology Foundation in China:

  • Ref. 2003I44001 “Dynamic strain measurement by using in-fibre Bragg grating” (2003-2004)
  • Ref. 2006ZD44001 “3D coordinate scanning measurement of the surface form of a small-sized aspherical artefact” (2007-2008)
  • Ref.2007ZD44013 “Automatic position error measurement for a pattern of small holes on an complicated curved shell” (2008-2009)

Research supervision:

  • Experience on supervision  of 3 MEng students in CIMM China.

Publications and Other Research Outputs

Article

Chen, X., Longstaff, A., Fletcher, S. and Myers, A. (2014) ‘Deployment and evaluation of a dual-sensor autofocusing method for on-machine measurement of patterns of small holes on freeform surfacesApplied Optics , 53 (10), pp. 2246-2255. ISSN 1559-128X

Chen, X., Longstaff, A., Fletcher, S. and Myers, A. (2014) ‘Analysing and evaluating a dual-sensor autofocusing method for measuring the position of patterns of small holes on complex curved surfacesSensors and Actuators A: Physical , 210, pp. 86-94. ISSN 0924-4247

Chen, X. and Koenders, L. (2014) ‘A novel pitch evaluation of one-dimensional gratings based on a cross-correlation filterMeasurement Science and Technology , 25 (4), p. 044007. ISSN 0957-0233

Chen, X. and Koenders, L. (2014) ‘A novel pitch evaluation of one-dimensional gratings based on a cross-correlation filterMeasurement Science and Technology , 25. ISSN 0957-0233

Chen, X., Longstaff, A., Parkinson, S. and Myers, A. (2014) ‘A Method for Rapid Detection and Evaluation of Position Errors of Patterns of Small Holes on Complex Curved and Freeform SurfacesInternational Journal of Precision Engineering and Manufacturing , 15 (2), pp. 209-217. ISSN 2234-7593

Chen, X., Wolff, H. and Koenders, L. (2012) ‘Atomic force microscope cantilevers as encoder for real-time displacement measurementsProceedings of SPIE - SPIE Defense, Security + Sensing, Baltimore, Md., 23-27, April, 2012, USA , 8378 (923005), p. 83780C-83780C. ISSN 0277786X

Chen, X., Koenders, L., Wolff, H., Neddermeyer, H. and Haertig, F. (2011) ‘Atomic force microscope cantilevers as encoders for real-time forward and backward displacement measurementsMeasurement Science and Technology , 22 (9), p. 094017. ISSN 0957-0233

Chen, X., Koenders, L. and H�rtig, F. (2011) ‘Real-time cross-correlation filtering of a one-dimensional grating position-encoded signalMeasurement Science and Technology , 22 (8), p. 085105. ISSN 0957-0233

Chen, X., Koenders, L., Wolff, H. and H�rtig, F. (2011) ‘Tuning-Fork Atomic Force Microscope Cantilever Encoder and Applications for Displacement and In-Plane Rotation Angle MeasurementProcedia Engineering: Proceedings of Eurosensors XXV, September 4-7, 2011, Athens, Greece , 25, pp. 555-558. ISSN 1877-7058

Chen, X., Wan, Y., Koenders, L. and Schilling, M. (2010) ‘Measurements of dimensional standards and etalons with feature size from tens of micrometres to millimetres by using sensor strengthened nanomeasuring machineMeasurement , 43 (10), pp. 1369-1375. ISSN 02632241

Chen, X., Koenders, L., Wolff, H., Haertig, F. and Schilling, M. (2010) ‘Atomic force microscope cantilever as an encoding sensor for real-time displacement measurementMeasurement Science and Technology , 21 (10), p. 105205. ISSN 0957-0233

Yang, T., Zuo, Y. and Chen, X. (2009) ‘Auto-focus technology and its application based on image processingComputer Simulation , 26 (7), pp. 256-259. ISSN 1006-9348

Chen, X., Ma, X., Zhu, Z. and Yang, D. (2008) ‘Development of SFM of probing sensor look-alikeJournal of Electronic Measurement and Instrument , 22 (Z2), pp. 359-365. ISSN 1000-7105

Chen, X., Grattan, K. and Dooley, R. (2002) ‘Optically interferometric roughness measurements for spherical surfaces by processing two microscopic interferogramsMeasurement , 32 (2), pp. 109-115. ISSN 0263-2241

Chen, X., Grattan, K. and Dooley, R. (2002) ‘Optically interferometric roughness measurements for spherical surfaces by processing two microscopic interferogramsMeasurement , 32 (2), pp. 109-115. ISSN 0263-2241

Cao, H., Chen, X., Grattan, K. and Sun, Y. (2002) ‘Automatic micro dimension measurement using image processing methodsMeasurement , 31 (2), pp. 71-76. ISSN 02632241

Forsyth, D., Wade, S., Sun, T., Chen, X. and Grattan, K. (2002) ‘Dual Temperature and Strain Measurement with the Combined Fluorescence Lifetime and Bragg Wavelength Shift Approach in Doped Optical FiberApplied Optics , 41 (31), p. 6585. ISSN 0003-6935

Marsh, J., Chiou, A., Asundi, A., Sidorin, Y., Osinski, M., Grattan, K., Wade, S., Forsyth, D., Sun, T., Chen, X., Bhattacharya, P., Podbielska, H., Osten, W., Tang, D., Chua, S., Ishibashi, A., Varadan, V., Jacques, S. and Wada, O. (2001) ‘Combined fluorescence decay time and fiber Bragg grating temperature and strain sensingProceedings of SPIE , 4596, pp. 90-96. ISSN 9780819443267

Chen, X., Cao, H., Zhou, Z. and Qi, A. (1998) ‘Design of a Laser Heterodyne Interferometer for 2-D Nanometer Scale MeasurementOptoelectronic Engineering , 25 (1), pp. 18-22. ISSN 1003-501X

Chen, X., Ren, D. and Li, Z. (1997) ‘Surface Roughness interferogram processing systemMetrology & Measurement Technology , 17 (3), pp. 7-10. ISSN 1002-6061

Chen, X (1994) ‘Threshold Optimization of interference image of surface roughness measuring interferometerActa Optica Sinica , 14 (11), pp. 1183-1186. ISSN 0253-2239

Chen, X. and Long, Z. (1993) ‘Automatic processing of interferogram from surface roughness measuring interferometerActa Optica Sinica , 13 (11), pp. 1040-1044. ISSN 0253-2239

Book

Chen, X (2011) Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements . Berlin, Germany: Mensch und Buch. ISBN 978 3 86387 079 9

Book Section

Chen, X., Longstaff, A., Fletcher, S. and Myers, A. (2013) ‘Evaluation of measurement technique for a precision aspheric artefact using a nano-measuring machine’. In: Laser Metrology and Machine Performance X. Euspen Headquarters, Bedfordshire, MK43 0AL, UK: Euspen. pp. 357-364. ISBN 978-0-9566790-1-7

Conference Item

Chen, X. and Koenders, L. (2013) ‘A novel pitch evaluation method based on a cross-correlation filter’. In: Nanoscale 2013, 25-26, April 2013, Paris, France

Chen, X., Longstaff, A., Fletcher, S. and Myers, A. (2013) ‘Evaluation of measurement technique for a precision aspheric artefact using a nano-measuring machine’. In: Lamdamap 10th International Conference, 20th-21st March 2013, Buckinghamshire, UK

Research Degree Supervision

Current opportunities

  • Please contact this member of staff to discuss possible opportunities.

Enterprise Activities

  • Has Part-time worked in Ping An Property Insurance Company Beijing Branch for 6 years as on-accident-site inspector to investigate and analyse the damage severity of analysis and measurement instruments.
  • Has part-time worked in EMC compliance Management Group (China) for 6 months as a technical English writer to write FCC and CE reports on EMC/EMI test of Chinese household electrical appliances.

Teaching and Professional Activities

  • Had experience of teaching measurement uncertainty (GUM), error theory and measurement data process, and experience of training metrologists in the length metrology and surface roughness measurement for industries in China, including lectures on theory and hand-on practice.
  • Intends to develop teaching courses on industry metrology, measurement control and instrumentation, Nanometrology and instrumentation, the principle of scanning probe microscopes (SPMs),etc.