Portrait of Dr Hussam Muhamedsalih Dr Hussam Muhamedsalih

h.muhamedsalih@hud.ac.uk | 01484 472393



Biography

Dr Hussam Muhamedsalih is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.

Hussam initially joined the University of Huddersfield to study for an MSc in Control Systems and Instrumentation, graduating in February 2008. Continuing his studies at Huddersfield, Hussam was awarded a PhD by the University of Huddersfield on 8th May 2013 for the project ‘Investigation of wavelength scanning interferometry for embedded metrology’, supervised by Prof. Xiangqian Jiang. On the 9th May 2013, he was appointed as a full-time position as research fellow at the CIMAM.

Hussam published more than 7 papers in international conference proceedings and prestigious journals such as 'Applied Optics', 'Optics Letter' and 'Proceedings of SPIE'. He is also co-inventor of one international patent (WO/2010/082066: Surface Characteristic Determining Apparatus). Currently, Dr Muhamedsalih is working under the FP7 project ‘NanoMend’, to develop novel technologies for the in-line detection of nano-scale defects for thin film barrier coatings on large area substrates.

Research and Scholarship

Currently, I am working as a research fellow under the FP7 project ‘NanoMend’, to develop novel technologies for the in-line detection of nano-scale defects for thin film barrier coatings on large area substrates using wavelength scanning interferometer.

Publications and Other Research Outputs

Article

Woodcock, R., Muhamedsalih, H., Martin, H. and Jiang, X. (2016) ‘Burg algorithm for enhancing measurement performance in wavelength scanning interferometrySurface Topography: Metrology and Properties , 4 (2), p. 024003. ISSN 2051-672X

Elrawemi, M., Blunt, L., Muhamedsalih, H., Gao, F. and Fleming, L. (2015) ‘Implementation of in Process Surface Metrology for R2R Flexible PV Barrier FilmsInternational Journal of Automation Technology , 9 (3), pp. 312-321. ISSN 1883-8022

Muhamedsalih, H., Jiang, X. and Gao, F. (2013) ‘Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noiseProcedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing , 10, pp. 70-76. ISSN 1877-7058

Muhamedsalih, H., Jiang, X. and Gao, F. (2013) ‘Accelerated Surface Measurement Using Wavelength Scanning Interferometer with Compensation of Environmental NoiseProcedia CIRP , 10, pp. 70-76. ISSN 2212-8271

Muhamedsalih, H., Gao, F. and Jiang, X. (2012) ‘Comparison study of algorithms and accuracy in the wavelength scanning interferometryApplied Optics , 51 (36), pp. 8854-8862. ISSN 0003-6935

Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘In-Process Fast Surface Measurement Using Wavelength Scanning InterferometryAdvanced Materials Research , 622-62, pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘Surface and thickness measurement of a transparent film using wavelength scanning interferometryOptics Express , 20 (19), p. 21450. ISSN 1094-4087

Jiang, X., Wang, K., Gao, F. and Muhamedsalih, H. (2010) ‘Fast surface measurement using wavelength scanning interferometry with compensation of environmental noiseApplied Optics , 49 (15), pp. 2903-2909. ISSN 1559-128X

Book Section

Gao, F., Muhamedsalih, H., Tang, D., Elrawemi, M., Blunt, L., Jiang, X., Edge, S., Bird, D. and Hollis, P. (2015) ‘In-situ defect detection systems for R2R flexible PV films’. In: ASPE 2015 Summer Topical Meeting. Colarado, USA: American Society for Precision Engineering. pp. 44-49. ISBN 978-1-887706-68-1

Moschetti, G., Muhamedsalih, H., Jiang, X., Leach, R. and O'Connor, D. (2015) ‘Extending the vertical range of wavelength scanning interferometry’. In: Proceedings of the 5th ASPE Topical Meeting on Precision Interferometric Metrology. : American Society for Precision Engineering. pp. 50-55. ISBN 978-1-887706-68-1

Blunt, L., Muhamedsalih, H. and Elrawemi, M. (2015) ‘Implementation of wavelength scanning interferometry for R2R flexible PV barrier films’. In: EUSPEN 15th International Conference & Exhibition. Leuven, Belgium: EUSPEN. . ISBN 978-0-9566790-7-9

Moschetti, G., Muhamedsalih, H., Connor, D., Jiang, X. and Leach, R. (2015) ‘Vertical axis non-linearities in wavelength scanning interferometry’. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. Huddersfield, UK: EUSPEN. pp. 31-39. ISBN 978-0-9566790-5-5

Muhamedsalih, H., Blunt, L., Martin, H., Hamersma, I., Elrawemi, M. and Feng, G. (2015) ‘An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process’. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. Huddersfield, UK: EUSPEN. pp. 99-107. ISBN 978-0-9566790-5-5

Muhamedsalih, H., Elrawemi, M., Blunt, L., Xiangqi, L. and Martin, H. (2015) ‘A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process’. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. Huddersfield, UK: EUSPEN. pp. 84-91. ISBN 978-0-9566790-5-5

Blunt, L., Elrawemi, M., Fleming, L., Robbins, D. and Muhamedsalih, H. (2014) ‘In-line metrology for defect assessment on large area Roll 2 Roll substrates’. In: 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI 2014). : Curran Associates. pp. 1-6. ISBN 9781632667311

Muhamedsalih, H., Blunt, L., Martin, H., Jiang, X. and Elrawemi, M. (2014) ‘An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry’. In: Proceedings of EUSPEN 14th International Conference 2014. Dubrovnik, Croatia: EUSPEN. pp. 177-180. ISBN 978-0-9566790-3-1

Blunt, L., Elrawemi, M., Fleming, L., Martin, H., Muhamedsalih, H. and Robbins, D. (2013) ‘Development of the basis for in process metrology for roll to roll production of flexible photovoltaics’. In: Proceedings of the 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry. Gdansk, Poland: International Measurement Confederation (IMEKO). pp. 363-366. ISBN 978-1-63266-817-2

Blunt, L., Fleming, L., Elrawemi, M., Robbins, D. and Muhamedsalih, H. (2013) ‘In-line metrology of functional surfaces with a focus on defect assessment on large area Roll to Roll substrates’. In: Proceedings of the 13th international conference of the european society for precision engineering and nanotechnology. Germany, Berlin: EUSPEN. pp. 71-74. ISBN 13:978-0-9566790-2-4

Muhamedsalih, H., Jiang, X. and Gao, F. (2011) ‘Comparison of fast Fourier transform and convolution in wavelength scanning interferometry’. In: Proceedings of SPIE Volume 8082. : SPIE Optical Metrology. p. 80820Q-80820Q.

Muhamedsalih, H., Jiang, X. and Gao, F. (2010) ‘Vibration compensation of wavelength scanning interferometer for in-process surface inspection’. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. Huddersfield: University of Huddersfield. pp. 148-153. ISBN 9781862180932

Muhamedsalih, H., Jiang, X. and Gao, F. (2009) ‘Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform.’. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. Huddersfield: University of Huddersfield. pp. 33-37. ISBN 9781862180857

Conference Item

Gao, F., Muhamedsalih, H., Tang, D., Elrawemi, M., Blunt, L., Jiang, X., Edge, S., Bird, D. and Hollis, P. (2015) ‘In-situ defect detection systems for R2R flexible PV barrier films’. In: International Conference on Optical Instrument and Technology (OIT’2015), 17th-19th May, Beijing, China

Gao, F., Muhamedsalih, H., Elrawemi, M., Blunt, L., Jiang, X., Edge, S., Bird, D. and Hollis, P. (2014) ‘A flexible PV barrier films defects detection system for in-situ R2R film processing’. In: Special Interest Group Meeting: Structured Freeform Surfaces 2014 Programme, 19-20 Nov 2014, Padova, Italy

Elrawemi, M., Blunt, L., Fleming, L. and Muhamedsalih, H. (2014) ‘Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment’. In: 10th LVMC Large Volume Metrology Conference and Exhibition, 18th -20th November 2014, The Mercure Manchester Piccadilly, UK

Elrawemi, M., Blunt, L., Fleming, L., Muhamedsalih, H. and Gao, F. (2014) ‘Wavelength Scanning Interferometry for PV Production In-line Metrology’. In: 3rd Annual EPSRC Manufacturing the Future Conference, 23rd – 24th September 2014, Glasgow Science Centre, Glasgow, UK , pp. 66-67

Elrawemi, M., Blunt, L., Muhamedsalih, H., Fleming, L. and Gao, F. (2014) ‘Verification of an in Process Optical System based on High Resolution Interferometry for Detecting Flexible PV Barrier Films Defects’. In: Photon14, 1-4 September 2014, Imperial College, London, UK

Elrawemi, M., Muhamedsalih, H., Blunt, L., Fleming, L., Martin, H. and Jiang, X. (2014) ‘Comparative study between online and offline defect assessment methods for roll to roll flexible PV modules’. In: 4th International Conference on Nanomanufacturing (nanoMan2014), 8-10 July, Bremen, Germany , pp. 1-5

Blunt, L., Elrawemi, M., Fleming, L., Martin, H., Muhamedsalih, H. and Robbins, D. (2013) ‘Metrology for in process metrology for roll to roll production of flexible photovoltaics’. In: Metrology Technologies to Enable Reel to Reel Processing of Emerging Products, November 20, 2013, National Physical Laboratory , Teddington, Middlesex, UK.

Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘In-process fast surface measurement using wavelength scanning interferometry’. In: 2012 International Conference on Manufacturing and Optimization, September 15-16, 2012, Beijing, China

Muhamedsalih, H., Jiang, X. and Gao, F. (2011) ‘Acceleration computing process in wavelength scanning interferometry’. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011), 29th June - 2nd July 2011, Daejeon, S. Korea

Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2011) ‘Wavelength scanning interferometry for measuring transparent films of the fusion targets’. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK , pp. 172-176

Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2010) ‘Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target’. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford

Muhamedsalih, H., Jiang, X. and Wang, K. (2009) ‘Surface Profile Height Measurement Using Optical Interferometry Method’. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield

Thesis

Muhamedsalih, H (2013) Investigation of Wavelength Scanning Interferometry for Embedded Metrology Doctoral thesis, University of Huddersfield.

Research Degree Supervision

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