The work of the Electron Microscopy and Materials Analysis Group is focussed around ion irradiation of materials, but has a range of other equipment available to support this effort.
The Huddersfield JEOL JEM-3010 TEM is a high resolution transmission electron microscope capable of lattice imaging. It is equipped with digital image capture, microanalysis via energy dispersive X-ray analysis and an electron energy loss spectroscopy system.
The FEI dual-beam Focused Ion Beam (FIB) system is capable of machining at the nanoscale and is used mainly for the preparation of TEM foils <100 nm in thickness. Other work undertaken includes nano-patterning of surfaces to improve wear performance, and cross-sectioning materials to look at internal structures.
The FEI Quanta 250 Field Emission Gun Environmental Scanning Electron Microscope (FEG-ESEM) is capable of achieving a resolution of 1.2 nm at 30 keV in High Vacuum mode. The microscope also possesses a low vacuum mode for studying insulating samples where charging effects are a concern i.e. polymers etc. The ESEM capability means that biological specimens can be investigated without the need for complex preparation methods. An Oxford Instruments Energy Dispersive X-Ray (EDX) detector is attached which allows the chemistry of a specimen to be investigated on the sub-micron scale.
Sample Preparation Facilities
The MIAMI facility has a large variety of sample preparation equipment available to make high quality electron transparent foils.